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The chapter focuses on the design and simulation of basic combinational CMOS logic gates, specifically the NAND and NOR gates. It outlines the objectives, procedures, and experiments necessary for understanding their operational characteristics, with a detailed emphasis on simulations and practical applications in digital VLSI design. Key activities include schematic capture, functional verification, transient analysis, and transistor sizing optimization to enhance performance.
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References
Untitled document (14).pdfClass Notes
Memorization
What we have learnt
Final Test
Revision Tests
Term: CMOS Logic
Definition: A technology for constructing integrated circuits that use complementary and symmetrical pairs of p-type and n-type MOSFETs for logic functions.
Term: Logical Effort
Definition: A method for estimating the delay of a gate relative to an ideal inverter, factoring in the input capacitance and drive capability.
Term: Truth Table
Definition: A table that shows all possible input combinations to a logic gate and the corresponding output.
Term: Voltage Transfer Characteristic (VTC)
Definition: A graphical representation that shows how the output voltage of a circuit varies with the input voltage.
Term: Propagation Delay
Definition: The time it takes for a signal to travel through a gate, typically denoted as tpHL and tpLH for high-to-low and low-to-high transitions, respectively.