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This lab module guides students through the design and verification of combinational CMOS logic gates, specifically focusing on the 2-input NAND and NOR gates. It emphasizes extending layout expertise, mastering complex routing, adhering to design rules, and understanding performance-driven layouts. Additionally, it covers the importance of physical verification and post-layout simulation to ensure functional correctness and performance analysis of the designs.
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References
Untitled document (15).pdfClass Notes
Memorization
What we have learnt
Final Test
Revision Tests
Term: Combinational Logic Gates
Definition: Logic gates (like NAND and NOR) whose output strictly depends on current input values at any point in time.
Term: Design Rule Check (DRC)
Definition: A verification process that checks the layout against prescribed geometric rules to ensure manufacturability.
Term: Layout Versus Schematic (LVS)
Definition: A verification method that compares the physical layout's electrical connectivity with that of the original schematic to ensure they match.
Term: Parasitic Extraction
Definition: The process that identifies and incorporates unintended parasitic capacitances and resistances from the layout into the simulation to provide a more accurate performance prediction.
Term: Common Centroid Layout
Definition: A layout technique where multiple transistors are interleaved around a common center to minimize variation due to manufacturing imperfections.