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This lab focuses on understanding and building basic memory circuits, specifically the CMOS D-Latch and D-Flip-Flop. Students explore the differences between sequential and combinational logic, learn about key timing rules such as setup time and hold time, and address issues like metastability in digital systems. The practical aspect includes drawing and simulating circuits, measuring performance, and analyzing results to ensure correct operation under specified conditions.
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4.2
Part B: Testing How It Works (Functionality) And Measuring Clock-To-Output Delay
This section focuses on testing the functionality of CMOS D-Latches and D-Flip-Flops while measuring critical timing parameters like clock-to-output delay, setup time, hold time, and metastability.
References
Untitled document (16).pdfClass Notes
Memorization
What we have learnt
Final Test
Revision Tests
Term: Sequential Logic
Definition: Types of circuits that have memory and whose outputs depend on current inputs and previous states.
Term: DLatch
Definition: A memory device that captures input data and maintains its value while the clock signal is low.
Term: DFlipFlop
Definition: An edge-triggered memory device that changes its output only at specific moments during the clock signal transitions.
Term: Setup Time (t_setup)
Definition: The minimum time before the clock edge that an input must be stable to guarantee proper operation.
Term: Hold Time (t_hold)
Definition: The minimum time after the clock edge that the input must remain stable to ensure the output is correctly captured.
Term: ClocktoOutput Delay (t_CQ)
Definition: The time taken for the output to reflect a change after the clock signal activates.
Term: Metastability
Definition: A state where the flip-flop is uncertain between output states due to violations of timing requirements.