Practice Part B: Testing How It Works (Functionality) and Measuring Clock-to-Output Delay - 4.2 | Lab Module 8: Introduction to Sequential Logic: CMOS D-Latch/Flip-Flop Schematic and Simulation | VLSI Design Lab
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4.2 - Part B: Testing How It Works (Functionality) and Measuring Clock-to-Output Delay

Learning

Practice Questions

Test your understanding with targeted questions related to the topic.

Question 1

Easy

Define what a D-Latch is.

💡 Hint: Think about how it captures input data.

Question 2

Easy

What does t_CQ signify?

💡 Hint: What timing parameter relates to output response time?

Practice 4 more questions and get performance evaluation

Interactive Quizzes

Engage in quick quizzes to reinforce what you've learned and check your comprehension.

Question 1

What does t_CQ represent in a D-Flip-Flop?

  • Time until the clock signal rises
  • Time taken for output to change after clock edge
  • Time taken for input signal to stabilize

💡 Hint: Think about what you measure after clock edges.

Question 2

True or False: A D-Latch responds to clock edges like a D-Flip-Flop.

  • True
  • False

💡 Hint: Reflect on the difference between level and edge sensitivity.

Solve 1 more question and get performance evaluation

Challenge Problems

Push your limits with challenges.

Question 1

You have a flip-flop with a setup time of 150 ps, a hold time of 50 ps, and you need to transmit data at a clock rate of 2 GHz. If the data signal changes 120 ps before the clock edge, will you encounter issues?

💡 Hint: Check the timing relative to the clock edge.

Question 2

Given a system where metastability calculations indicate a flip-flop may sometimes resolve within 10 ns, what would you suggest to improve system reliability?

💡 Hint: Consider increasing the number of flip-flops or adding filtering stages.

Challenge and get performance evaluation