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Test your understanding with targeted questions related to the topic.
Question 1
Easy
What does SPC stand for in the context of semiconductor manufacturing?
💡 Hint: Think about how we monitor processes.
Question 2
Easy
Name one improvement made for the gate poly etch selectivity.
💡 Hint: It involves maintaining consistent conditions.
Practice 4 more questions and get performance evaluation
Engage in quick quizzes to reinforce what you've learned and check your comprehension.
Question 1
What improvement was achieved by tightening SPC limits on the ALD tool?
💡 Hint: Remember specific figures mentioned in the case studies.
Question 2
True or False: Replacing the PVD barrier layer was unnecessary for improving reliability.
💡 Hint: Think about the changes made to enhance process performance.
Solve and get performance evaluation
Push your limits with challenges.
Question 1
Given a hypothetical semiconductor process with a spacer thickness variation of ±2 nm, analyze how this could lead to yield issues and propose one method to rectify it.
💡 Hint: Consider the factors that lead to electrical failures on the die.
Question 2
In a new fabrication line, the target defect rate is below 1%. Based on the lessons learned from the patterns of past integration issues explored, strategize upon what procedures you would introduce.
💡 Hint: Reflect on what features were key in previous successful outcomes.
Challenge and get performance evaluation