Practice Faster Debugging and Fault Isolation - 1.4.1 | 1. Introduction to Design for Testability | Design for Testability
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Practice Questions

Test your understanding with targeted questions related to the topic.

Question 1

Easy

What does DFT stand for?

💡 Hint: What is the acronym for the design methodology discussed?

Question 2

Easy

Explain how BIST contributes to faster debugging.

💡 Hint: Think about self-testing and external dependencies.

Practice 1 more question and get performance evaluation

Interactive Quizzes

Engage in quick quizzes to reinforce what you've learned and check your comprehension.

Question 1

What is the primary benefit of using DFT in electronic design?

  • Higher costs
  • Faster debugging
  • More complexity

💡 Hint: Think about the goals of DFT.

Question 2

True or False: BIST requires external equipment to function.

  • True
  • False

💡 Hint: Consider the self-testing capabilities.

Solve and get performance evaluation

Challenge Problems

Push your limits with challenges.

Question 1

You are designing a new PCB and need to ensure minimal debugging time. Describe how you would incorporate DFT strategies into your design.

💡 Hint: Consider important design features that enhance testability.

Question 2

Analyze the potential risks associated with not implementing DFT in a high-stakes electronic system.

💡 Hint: Think about the consequences of poor testing practices.

Challenge and get performance evaluation