1.4.1. Faster Debugging and Fault Isolation

Try these first

1. 1.

   What does DFT stand for?

   Hint

   What is the acronym for the design methodology discussed?

2. 2.

   Explain how BIST contributes to faster debugging.

   Hint

   Think about self-testing and external dependencies.

3. 3.

   What is the primary benefit of using DFT in electronic design?

   • Higher costs
   • Faster debugging
   • More complexity

   Hint

   Think about the goals of DFT.

4. 4.

   True or False: BIST requires external equipment to function.

   • True
   • False

   Hint

   Consider the self-testing capabilities.

5. 5.

   You are designing a new PCB and need to ensure minimal debugging time. Describe how you would incorporate DFT strategies into your design.

   Hint

   Consider important design features that enhance testability.

6. 6.

   Analyze the potential risks associated with not implementing DFT in a high-stakes electronic system.

   Hint

   Think about the consequences of poor testing practices.