Design for Testability

The chapter discusses advanced topics and emerging trends in Design for Testability (DFT), with a focus on how traditional techniques are adapting to the complexities of modern electronic systems. It highlights various innovations such as AI-driven test generation, test compression, self-testable systems, and in-system testing, all of which are essential for improving testing efficiency and fault coverage in system-on-chip (SoC) and multi-core processor designs. By embracing these advancements, engineers can better ensure the reliability and maintainability of their designs.