4. Built-in Self-Test (BIST) Techniques
Built-In Self-Test (BIST) is a modern approach in electronic testing that integrates self-testing capabilities into circuits, enhancing efficiency and reliability. It allows for ongoing diagnostics, minimizes the need for external equipment, and provides substantial fault coverage. While BIST is beneficial in various applications, its design complexity and limitations in fault detection must be carefully evaluated.
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What we have learnt
- BIST incorporates self-testing capabilities into electronic circuits.
- Effective fault coverage is a key goal of BIST, enabling the detection of various faults in systems.
- While BIST offers cost and efficiency advantages, it also presents challenges in design complexity and fault detection for non-typical faults.
Key Concepts
- -- BuiltIn SelfTest (BIST)
- A technique that allows a system to test itself through integrated test circuits.
- -- Test Pattern Generation
- The process of creating test inputs for a circuit under test, which can be pseudo-random or deterministic.
- -- Fault Coverage
- The extent to which a test can detect possible faults in a circuit.
- -- Logic BIST
- A BIST technique focused on testing digital logic circuits.
- -- Memory BIST
- A BIST technique specifically for testing memory components such as RAM and ROM.
- -- Analog BIST
- BIST tailored for testing analog circuits by measuring their performance against expected behavior.
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