10. Advanced Topics and Emerging Trends in Design for Testability
The chapter discusses advanced topics and emerging trends in Design for Testability (DFT), with a focus on how traditional techniques are adapting to the complexities of modern electronic systems. It highlights various innovations such as AI-driven test generation, test compression, self-testable systems, and in-system testing, all of which are essential for improving testing efficiency and fault coverage in system-on-chip (SoC) and multi-core processor designs. By embracing these advancements, engineers can better ensure the reliability and maintainability of their designs.
Enroll to start learning
You've not yet enrolled in this course. Please enroll for free to listen to audio lessons, classroom podcasts and take practice test.
Sections
Navigate through the learning materials and practice exercises.
What we have learnt
- Traditional DFT techniques must evolve to handle the increasing complexity of circuits.
- Emerging trends like AI and in-system testing are enhancing testing efficiency and fault coverage.
- Self-testable and self-healing systems are critical for mission-critical applications.
Key Concepts
- -- AIDriven Test Generation
- The use of artificial intelligence in generating test patterns automatically, enhancing fault detection and coverage.
- -- Test Compression
- Techniques designed to reduce the size of test data needed for testing, thereby improving efficiency and lowering memory usage.
- -- InSystem Testability
- The ability to test and diagnose systems while they are integrated into the final product, allowing for efficient operational testing.
- -- SelfHealing Systems
- Systems capable of detecting and correcting faults autonomously, ensuring continuous operation in critical scenarios.
Additional Learning Materials
Supplementary resources to enhance your learning experience.