Design for Testability | 8. Design for Testability Strategies by Pavan | Learn Smarter
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8. Design for Testability Strategies

Design for Testability (DFT) strategies integrate testing requirements into the design process of electronic systems, facilitating improved verification and debugging. This approach not only enhances product quality but also reduces testing costs and time-to-market. Various DFT techniques such as scan-based testing, Built-In Self-Test (BIST), and boundary scan (IEEE 1149.1) are explored in this chapter, emphasizing their importance in modern electronics design.

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Sections

  • 8

    Design For Testability Strategies

    This section provides an overview of Design for Testability (DFT) strategies that enhance the effectiveness of testing electronic systems.

    Learning Practice

  • 8.1

    Introduction To Design For Testability (Dft) Strategies

    Design for Testability (DFT) is an essential approach in electronic system design, aimed at simplifying testing and improving product quality.

    Learning Practice

  • 8.2

    Common Design For Testability (Dft) Techniques

    This section outlines common DFT techniques used to enhance the testability of electronic systems.

    Learning Practice

  • 8.2.1

    Scan-Based Testing

    Scan-based testing is a crucial DFT technique that integrates scan chains into circuit designs to facilitate testing by allowing access to internal states.

    Learning Practice

  • 8.2.2

    Built-In Self-Test (Bist)

    Built-In Self-Test (BIST) is a Design for Testability strategy that enables systems to perform self-testing through embedded test patterns and diagnostic routines.

    Learning Practice

  • 8.2.3

    Boundary Scan (Ieee 1149.1, Jtag)

    Boundary Scan (IEEE 1149.1) is a testing methodology that allows for testing interconnections between integrated circuits without direct access to the pins.

    Learning Practice

  • 8.3

    Additional Dft Strategies

    This section discusses important additional strategies for Design for Testability (DFT), focusing on Test Pattern Generation (TPG), Design for Manufacturability (DFM), and Design for Reliability (DFR).

    Learning Practice

  • 8.3.1

    Test Pattern Generation (Tpg) And Atpg

    This section discusses Test Pattern Generation (TPG) and Automated Test Pattern Generation (ATPG) as essential processes in digital circuit testing to enhance fault detection.

    Learning Practice

  • 8.3.2

    Design For Manufacturability (Dfm) And Design For Reliability (Dfr)

    Design for Manufacturability (DFM) and Design for Reliability (DFR) aim to optimize product designs for easier manufacturing and long-term reliability.

    Learning Practice

  • 8.4

    Optimizing Dft Strategies For Efficient Testing

    This section discusses techniques for optimizing Design for Testability (DFT) strategies to improve testing efficiency and reduce costs.

    Learning Practice

  • 8.4.1

    Test Compression

    Test compression reduces the volume of test data needed during the testing phase of electronic systems.

    Learning Practice

  • 8.4.2

    Testable Design Architecture

    This section discusses optimizing design for testability through hierarchical testing and enhancing observability and controllability.

    Learning Practice

  • 8.5

    Conclusion

    The conclusion emphasizes the importance of Design for Testability (DFT) in modern electronics, highlighting its role in simplifying testing and enhancing product quality.

    Learning Practice

References

eepe-dt8.pdf

Class Notes

Memorization

What we have learnt

  • DFT ensures that testing is...
  • Techniques like scan-based ...
  • Design for Manufacturabilit...

Final Test

Revision Tests