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8. Design for Testability Strategies
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Mixed questions from across the chapter. Your answers get marked.
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Flashcard drill
5 cards from this lesson. Good the night before a test.
Try these first
- 1.
What is DFT?
Hint
Think about why testing is essential.
- 2.
Give an advantage of scan chains.
Hint
Consider what scan chains allow.
- 3.
What does DFT stand for?
- Design for Technology
- Design for Testability
- Design for Training
Hint
What helps simplify testing?
- 4.
True or False: BIST requires external testing equipment.
- True
- False
Hint
Think about what BIST means for external dependencies.
- 5.
Analyze the impact of neglecting to integrate DFT practices in a complex system design. Discuss potential outcomes.
Hint
Consider the ripple effects in production and testing.
- 6.
Devise a testing strategy for a new embedded system that includes both BIST and Boundary Scan. Evaluate potential effectiveness.
Hint
What advantages do both methods offer?
Exercises
Total Questions
2
Estimated Time
4 min
Passing Score
70%
Instructions
- Read each question carefully
- You can use hints if you need help
- Complete all questions before submitting
4 more questions available
Enrol freeQuiz
Total Questions
2
Estimated Time
4 min
Passing Score
70%
Instructions
- Read each question carefully
- You can use hints if you need help
- Complete all questions before submitting
2 more questions available
Enrol freeChallenge Problems
Total Questions
2
Estimated Time
4 min
Passing Score
70%
Instructions
- Read each question carefully
- You can use hints if you need help
- Complete all questions before submitting