Design for Testability | 5. Scan Chains and Serial Testing by Pavan | Learn Smarter
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5. Scan Chains and Serial Testing

Scan chains and serial testing are pivotal techniques in Design for Testability (DFT) that enhance the testability of digital circuits. These methods enable designers to access and test internal components of complex integrated circuits, ensuring functionality through structured fault detection. While offering high fault coverage and reduced testing costs, challenges such as increased design complexity and limited fault coverage in complex systems should also be addressed.

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Sections

  • 5

    Scan Chains And Serial Testing

    Scan chains and serial testing are critical techniques in digital circuit testing that enhance testability and support efficient fault detection.

    Learning Practice

  • 5.1

    Introduction To Scan Chains And Serial Testing

    This section introduces scan chains and serial testing as vital techniques for enhancing the testability of complex digital circuits.

    Learning Practice

  • 5.2

    Concept Of Scan Chains

    This section explains the concept of scan chains, highlighting their structure and functionality in digital circuit testing.

    Learning Practice

  • 5.2.1

    What Is A Scan Chain?

    A scan chain is a sequence of flip-flops connected in a series to facilitate the testing of digital circuits by allowing internal states to be accessed.

    Learning Practice

  • 5.2.2

    How Scan Chains Work

    This section explains how scan chains function during testing phases in digital circuits, emphasizing test pattern application and the flow of test data.

    Learning Practice

  • 5.3

    Role Of Scan Chains In Serial Testing

    Scan chains are integral to the process of serial testing, enhancing fault detection and coverage in digital circuits.

    Learning Practice

  • 5.3.1

    Fault Detection With Serial Testing

    This section covers how scan chains facilitate fault detection in digital circuits through serial testing, enhancing observability and controllability.

    Learning Practice

  • 5.3.2

    Fault Coverage With Scan Chains

    This section discusses how scan chains contribute to high fault coverage in digital circuit testing, particularly identifying various faults effectively.

    Learning Practice

  • 5.4

    Advantages Of Scan Chains And Serial Testing

    Scan chains and serial testing enhance the testability of digital circuits by simplifying internal access and improving fault detection.

    Learning Practice

  • 5.4.1

    Simplified Access To Internal Circuitry

    This section discusses how scan chains simplify access to a circuit's internal workings, making testing more efficient.

    Learning Practice

  • 5.4.2

    Comprehensive Fault Detection

    Comprehensive fault detection through scan chains significantly enhances testing efficacy for digital circuits.

    Learning Practice

  • 5.4.3

    Reduced Testing Time And Cost

    This section discusses how scan chains can significantly lower testing time and costs in digital circuits.

    Learning Practice

  • 5.4.4

    Improved Yield And Reliability

    This section discusses how scan chains enhance the yield and reliability of digital circuits by enabling early defect identification.

    Learning Practice

  • 5.5

    Limitations Of Scan Chains And Serial Testing

    This section discusses the limitations of scan chains and serial testing in digital circuits, focusing on design overhead, testing analog systems, and the challenges of fault coverage in complex systems.

    Learning Practice

  • 5.5.1

    Design Overhead

    This section discusses the design overhead associated with integrating scan chains into digital circuits for testing purposes.

    Learning Practice

  • 5.5.2

    Testing Of Analog Or Mixed-Signal Systems

    This section discusses the limitations of scan chains and serial testing when applied to analog circuits and mixed-signal systems.

    Learning Practice

  • 5.5.3

    Limited Fault Coverage In Complex Systems

    This section discusses the limitations of scan chains and serial testing in achieving complete fault coverage in complex systems.

    Learning Practice

  • 5.6

    Conclusion

    The conclusion emphasizes the importance of scan chains and serial testing in enhancing the testability of digital circuits.

    Learning Practice

References

eepe-dt5.pdf

Class Notes

Memorization

What we have learnt

  • Scan chains improve testabi...
  • Serial testing enables effe...
  • Scan-based testing simplifi...

Final Test

Revision Tests