Practice Improved Yield and Reliability - 5.4.4 | 5. Scan Chains and Serial Testing | Design for Testability
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Practice Questions

Test your understanding with targeted questions related to the topic.

Question 1

Easy

Define yield in the context of manufacturing.

💡 Hint: Think about the output of a manufacturing process compared to what was intended.

Question 2

Easy

What is reliability in digital circuits?

💡 Hint: Consider a circuit's ability to function correctly continuously.

Practice 4 more questions and get performance evaluation

Interactive Quizzes

Engage in quick quizzes to reinforce what you've learned and check your comprehension.

Question 1

What does a higher yield indicate in manufacturing?

  • More defects
  • Fewer functional products
  • Higher functional yield

💡 Hint: Think about the success rate in manufacturing.

Question 2

True or False: Reliability refers to the number of times a product can be tested without failure.

  • True
  • False

💡 Hint: Consider what reliability means in real-world applications.

Solve and get performance evaluation

Challenge Problems

Push your limits with challenges.

Question 1

In a production line of 1000 circuits, if 850 are functional, what is the yield? How does implementing scan chains change this?

💡 Hint: Review how yield is calculated.

Question 2

Imagine a scenario in a production factory where a design change has decreased reliability. How might scan chains assist in restoring reliability?

💡 Hint: Focus on how increased testing can uncover design flaws.

Challenge and get performance evaluation