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Practice Questions
Test your understanding with targeted questions related to the topic.
Question 1
Easy
What is a stuck-at fault?
💡 Hint: Think about how circuits behave normally.
Question 2
Easy
How do scan chains help detect faults?
💡 Hint: Consider both observability and controllability.
Practice 4 more questions and get performance evaluation
Interactive Quizzes
Engage in quick quizzes to reinforce what you've learned and check your comprehension.
Question 1
What type of fault occurs when a node is stuck at a logical high or low?
- Delay Fault
- Stuck-At Fault
- Bridging Fault
💡 Hint: Remember the definition of stuck-at faults.
Question 2
True or False: Scan chains can completely eliminate all types of faults.
- True
- False
💡 Hint: Consider the limitations discussed.
Solve 2 more questions and get performance evaluation
Challenge Problems
Push your limits with challenges.
Question 1
Design a circuit that could potentially include stuck-at faults and outline a testing strategy using scan chains.
💡 Hint: Think about handling each node in your test design.
Question 2
Consider a complex IC that implemented scan chains. Discuss the potential consequences if delay faults are overlooked during testing.
💡 Hint: Reflect on what timing inconsistencies could lead to in synchronous systems.
Challenge and get performance evaluation