Practice Limitations of Scan Chains and Serial Testing - 5.5 | 5. Scan Chains and Serial Testing | Design for Testability
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Practice Questions

Test your understanding with targeted questions related to the topic.

Question 1

Easy

What is design overhead?

💡 Hint: Think about what happens when you add more components to any circuit.

Question 2

Easy

Why can't scan chains be used for analog testing?

💡 Hint: Consider the nature of the signals in analog circuits.

Practice 4 more questions and get performance evaluation

Interactive Quizzes

Engage in quick quizzes to reinforce what you've learned and check your comprehension.

Question 1

What contributes to the design overhead of scan chains?

  • Increased component complexity
  • Lower power consumption
  • Fewer components

💡 Hint: Think about how adding more parts affects a circuit's complexity.

Question 2

Can scan chains be applied to mixed-signal systems?

  • True
  • False

💡 Hint: Reflect on what makes mixed-signal systems different from purely digital systems.

Solve 1 more question and get performance evaluation

Challenge Problems

Push your limits with challenges.

Question 1

Propose a methodology to improve the detection of parasitic faults in a complex digital circuit using scan chains.

💡 Hint: Think about how you could layer testing methods.

Question 2

Design a testing strategy for a mixed-signal system that avoids the limitations of scan chains. Include at least three unique approaches.

💡 Hint: Reflect on how you can adapt your testing tools to the nature of the signals.

Challenge and get performance evaluation