Practice - Limitations of Scan Chains and Serial Testing
Enroll to start learning
You’ve not yet enrolled in this course. Please enroll for free to listen to audio lessons, classroom podcasts and take practice test.
Practice Questions
Test your understanding with targeted questions
What is design overhead?
💡 Hint: Think about what happens when you add more components to any circuit.
Why can't scan chains be used for analog testing?
💡 Hint: Consider the nature of the signals in analog circuits.
4 more questions available
Interactive Quizzes
Quick quizzes to reinforce your learning
What contributes to the design overhead of scan chains?
💡 Hint: Think about how adding more parts affects a circuit's complexity.
Can scan chains be applied to mixed-signal systems?
💡 Hint: Reflect on what makes mixed-signal systems different from purely digital systems.
1 more question available
Challenge Problems
Push your limits with advanced challenges
Propose a methodology to improve the detection of parasitic faults in a complex digital circuit using scan chains.
💡 Hint: Think about how you could layer testing methods.
Design a testing strategy for a mixed-signal system that avoids the limitations of scan chains. Include at least three unique approaches.
💡 Hint: Reflect on how you can adapt your testing tools to the nature of the signals.
Get performance evaluation
Reference links
Supplementary resources to enhance your learning experience.