5.5. Limitations of Scan Chains and Serial Testing

Try these first

1. 1.

   What is design overhead?

   Hint

   Think about what happens when you add more components to any circuit.

2. 2.

   Why can't scan chains be used for analog testing?

   Hint

   Consider the nature of the signals in analog circuits.

3. 3.

   What contributes to the design overhead of scan chains?

   • Increased component complexity
   • Lower power consumption
   • Fewer components

   Hint

   Think about how adding more parts affects a circuit's complexity.

4. 4.

   Can scan chains be applied to mixed-signal systems?

   • True
   • False

   Hint

   Reflect on what makes mixed-signal systems different from purely digital systems.

5. 5.

   Propose a methodology to improve the detection of parasitic faults in a complex digital circuit using scan chains.

   Hint

   Think about how you could layer testing methods.

6. 6.

   Design a testing strategy for a mixed-signal system that avoids the limitations of scan chains. Include at least three unique approaches.

   Hint

   Reflect on how you can adapt your testing tools to the nature of the signals.