2. Historical Context and Evolution of Testability Strategies
The evolution of testability strategies in electronic systems has progressed from manual inspections and basic functional tests to advanced methodologies such as Design for Testability (DFT) that incorporate self-testing features into designs. Emerging challenges posed by complex integrated circuits and system-on-chip technologies have necessitated the development of simultaneous fault models, automated test equipment, and innovative techniques, ensuring both reliability and efficiency in testing. As technology continues to advance, future testability strategies will leverage AI and quantum computing to further enhance testing processes.
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What we have learnt
- Testability strategies have evolved from manual testing to automated methods and built-in test capabilities.
- Design for Testability (DFT) integrates testing features directly into circuit designs to improve reliability and efficiency.
- Modern testing methodologies such as boundary scan, at-speed testing, and AI-driven approaches are addressing the complexities of current integrated circuit technologies.
Key Concepts
- -- Design for Testability (DFT)
- A strategy that incorporates testability features directly into the design of electronic systems to simplify testing and enhance fault detection.
- -- BuiltIn SelfTest (BIST)
- A methodology where circuits have embedded self-testing capabilities, generating and evaluating test patterns internally without needing external equipment.
- -- Automated Test Equipment (ATE)
- Systems that apply test vectors to circuits and automatically measure results, reducing human error and increasing testing efficiency.
- -- Boundary Scan
- An IEEE standard (JTAG) that provides a method for testing interconnections between chips on printed circuit boards, enhancing the testability of integrated circuits.
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