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Test your understanding with targeted questions related to the topic.
Question 1
Easy
What does ATE stand for?
💡 Hint: Think about what automates testing.
Question 2
Easy
What is a stuck-at fault?
💡 Hint: Consider its name—what does 'stuck' imply?
Practice 4 more questions and get performance evaluation
Engage in quick quizzes to reinforce what you've learned and check your comprehension.
Question 1
What does ATE primarily do?
💡 Hint: Remember its primary function in testing systems.
Question 2
True or False: The stuck-at fault model is a method used to automate testing.
💡 Hint: Consider the difference between fault diagnosis and testing automation.
Solve 1 more question and get performance evaluation
Push your limits with challenges.
Question 1
Design a basic fault model for a simple digital circuit with multiple logic gates. Describe its advantages.
💡 Hint: Consider different types of faults and how they might manifest in a circuit.
Question 2
Critically analyze the shift to ATE in the context of increasing complexity in IC design. What potential challenges could arise?
💡 Hint: Think about both the benefits and the logistical considerations involved.
Challenge and get performance evaluation