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2.3. The Emergence of Automated Testing (1970s – 1980s)
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11 questions on this section. Wrong answers show you what to read again.
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Mixed questions from across the chapter. Your answers get marked.
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Flashcard drill
3 cards from this lesson. Good the night before a test.
Try these first
- 1.
What does ATE stand for?
Hint
Think about what automates testing.
- 2.
What is a stuck-at fault?
Hint
Consider its name—what does 'stuck' imply?
- 3.
What does ATE primarily do?
- Applies test vectors
- Operates machinery
- Program software
Hint
Remember its primary function in testing systems.
- 4.
True or False: The stuck-at fault model is a method used to automate testing.
- True
- False
Hint
Consider the difference between fault diagnosis and testing automation.
- 5.
Design a basic fault model for a simple digital circuit with multiple logic gates. Describe its advantages.
Hint
Consider different types of faults and how they might manifest in a circuit.
- 6.
Critically analyze the shift to ATE in the context of increasing complexity in IC design. What potential challenges could arise?
Hint
Think about both the benefits and the logistical considerations involved.
Exercises
Total Questions
2
Estimated Time
4 min
Passing Score
70%
Instructions
- Read each question carefully
- You can use hints if you need help
- Complete all questions before submitting
4 more questions available
Enrol freeQuiz
Total Questions
2
Estimated Time
4 min
Passing Score
70%
Instructions
- Read each question carefully
- You can use hints if you need help
- Complete all questions before submitting
1 more question available
Enrol freeChallenge Problems
Total Questions
2
Estimated Time
4 min
Passing Score
70%
Instructions
- Read each question carefully
- You can use hints if you need help
- Complete all questions before submitting