2.4. The Advent of Design for Testability (DFT) (1990s – 2000s)

Try these first

1. 1.

   What does DFT stand for?

   Hint

   Think about the term and its significance in electronics.

2. 2.

   What is one advantage of BIST?

   Hint

   Consider what makes testing easier.

3. 3.

   What is the primary purpose of Design for Testability (DFT)?

   • To enhance aesthetics of design
   • To improve testing efficiency
   • To lower production costs

   Hint

   Focus on what DFT simplifies in circuit design.

4. 4.

   Built-In Self-Test (BIST) allows devices to do what?

   • True
   • False

   Hint

   Remember what self-testing means.

5. 5.

   Evaluate how the implementation of DFT could influence the overall design cycle of systems-on-chip.

   Hint

   Consider the relationship between testing efficiency and design iterations.

6. 6.

   Propose a scenario where Boundary Scan would become essential during manufacturing.

   Hint

   Think about common manufacturing challenges and how systematic approaches help.