Practice The Advent of Design for Testability (DFT) (1990s – 2000s) - 2.4 | 2. Historical Context and Evolution of Testability Strategies | Design for Testability
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Practice Questions

Test your understanding with targeted questions related to the topic.

Question 1

Easy

What does DFT stand for?

💡 Hint: Think about the term and its significance in electronics.

Question 2

Easy

What is one advantage of BIST?

💡 Hint: Consider what makes testing easier.

Practice 4 more questions and get performance evaluation

Interactive Quizzes

Engage in quick quizzes to reinforce what you've learned and check your comprehension.

Question 1

What is the primary purpose of Design for Testability (DFT)?

  • To enhance aesthetics of design
  • To improve testing efficiency
  • To lower production costs

💡 Hint: Focus on what DFT simplifies in circuit design.

Question 2

Built-In Self-Test (BIST) allows devices to do what?

  • True
  • False

💡 Hint: Remember what self-testing means.

Solve 2 more questions and get performance evaluation

Challenge Problems

Push your limits with challenges.

Question 1

Evaluate how the implementation of DFT could influence the overall design cycle of systems-on-chip.

💡 Hint: Consider the relationship between testing efficiency and design iterations.

Question 2

Propose a scenario where Boundary Scan would become essential during manufacturing.

💡 Hint: Think about common manufacturing challenges and how systematic approaches help.

Challenge and get performance evaluation