Practice Scan Chains and Built-In Self-Test (BIST) - 2.4.1 | 2. Historical Context and Evolution of Testability Strategies | Design for Testability
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Practice Questions

Test your understanding with targeted questions related to the topic.

Question 1

Easy

What is the purpose of scan chains in digital circuits?

💡 Hint: Think about how they connect components for testing.

Question 2

Easy

What does BIST stand for?

💡 Hint: Focus on the self-checking aspect.

Practice 4 more questions and get performance evaluation

Interactive Quizzes

Engage in quick quizzes to reinforce what you've learned and check your comprehension.

Question 1

What is the main function of scan chains?

  • To reduce circuit size
  • To manage internal state access
  • To improve power consumption

💡 Hint: Think about the role they play during testing.

Question 2

True or False: BIST requires external testing equipment.

  • True
  • False

💡 Hint: Remember the self-testing capabilities of BIST.

Solve 2 more questions and get performance evaluation

Challenge Problems

Push your limits with challenges.

Question 1

Design a simple circuit proposal that integrates scan chains and BIST. Explain how this will improve testing efficiency.

💡 Hint: Focus on how both methods complement each other in testing.

Question 2

Evaluate the potential challenges that might arise while implementing BIST in larger integrated circuits. How would you address these challenges?

💡 Hint: Consider both physical and operational aspects of circuit designs.

Challenge and get performance evaluation