1. Introduction to Design for Testability
Design for Testability (DFT) is a vital methodology for ensuring the functionality and reliability of modern electronic systems. By integrating testing considerations early in the design phase, DFT not only enhances product quality but also streamlines the verification process. Principles such as test access points and built-in self-test techniques are essential for effective fault detection, ultimately reducing costs and time-to-market for electronic products.
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What we have learnt
- DFT improves the testability of electronic systems during design.
- Incorporating DFT aids in early detection of errors and reduces manufacturing costs.
- Key concepts include test access points, built-in self-test systems, and improved fault coverage.
Key Concepts
- -- Test Access Points (TAPs)
- Features embedded in electronic designs to allow easy access for testing signals.
- -- BuiltIn SelfTest (BIST)
- Diagnostic tests run internally by a system without the need for external equipment.
- -- Test Coverage
- The extent to which a test suite verifies the correctness of a system's design.
- -- Observability and Controllability
- Observability refers to monitoring internal state during tests while controllability allows for managing input signals.
- -- Fault Coverage
- Measures how well a test process identifies potential failures in a system.
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