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Practice Questions
Test your understanding with targeted questions related to the topic.
Question 1
Easy
What is a scan chain designed for?
💡 Hint: Think about how data might move in a chain.
Question 2
Easy
What does BIST stand for?
💡 Hint: It's a method to allow systems to test themselves.
Practice 4 more questions and get performance evaluation
Interactive Quizzes
Engage in quick quizzes to reinforce what you've learned and check your comprehension.
Question 1
What is the primary purpose of Structural DFT methods?
- To increase the complexity of designs
- To facilitate easier testing of electronic systems
- To reduce manufacturing costs
💡 Hint: Consider what makes a system easier to verify.
Question 2
True or False: Built-In Self-Test (BIST) requires external testing equipment.
- True
- False
💡 Hint: Think about the term 'self-test'.
Solve 1 more question and get performance evaluation
Challenge Problems
Push your limits with challenges.
Question 1
Given a complex digital circuit with high integration, assess how implementing scan chain design might impact the testing speed and fault coverage.
💡 Hint: Reflect on the systematic process of testing multiple components through one strategy.
Question 2
Evaluate the trade-offs between utilizing BIST and relying solely on manual testing in a manufacturing environment. Which would you prefer and why?
💡 Hint: Consider the costs and benefits on both sides when weighing your decision.
Challenge and get performance evaluation