1.5.2. Structural DFT Methods

Try these first

1. 1.

   What is a scan chain designed for?

   Hint

   Think about how data might move in a chain.

2. 2.

   What does BIST stand for?

   Hint

   It's a method to allow systems to test themselves.

3. 3.

   What is the primary purpose of Structural DFT methods?

   • To increase the complexity of designs
   • To facilitate easier testing of electronic systems
   • To reduce manufacturing costs

   Hint

   Consider what makes a system easier to verify.

4. 4.

   True or False: Built-In Self-Test (BIST) requires external testing equipment.

   • True
   • False

   Hint

   Think about the term 'self-test'.

5. 5.

   Given a complex digital circuit with high integration, assess how implementing scan chain design might impact the testing speed and fault coverage.

   Hint

   Reflect on the systematic process of testing multiple components through one strategy.

6. 6.

   Evaluate the trade-offs between utilizing BIST and relying solely on manual testing in a manufacturing environment. Which would you prefer and why?

   Hint

   Consider the costs and benefits on both sides when weighing your decision.