Practice Improved Yield And Quality Control (1.4.2) - Introduction to Design for Testability
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Improved Yield and Quality Control

Practice - Improved Yield and Quality Control

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Learning

Practice Questions

Test your understanding with targeted questions

Question 1 Easy

What does DFT stand for?

💡 Hint: Look at the first mention of the term in the chapter.

Question 2 Easy

Why is early detection of defects important?

💡 Hint: Think about the impact of fixing problems at different stages of production.

4 more questions available

Interactive Quizzes

Quick quizzes to reinforce your learning

Question 1

What is the primary benefit of Design for Testability?

Increases the number of defects
Improves yield and quality control
Inefficient manufacturing processes

💡 Hint: Consider the purpose of embedding tests into a design.

Question 2

True or False: DFT can lead to a higher rate of product returns.

True
False

💡 Hint: Reflect on the definition and goals of DFT.

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Challenge Problems

Push your limits with advanced challenges

Challenge 1 Hard

You are leading a team designing a medical device. Explain how you would incorporate DFT to ensure the product is of high quality before it reaches patients.

💡 Hint: Consider the critical nature of medical devices and the impact of their reliability.

Challenge 2 Hard

Critically assess the effectiveness of using DFT in contrasting two electronics products, one utilizing DFT and another that does not.

💡 Hint: Think about the long-term benefits versus short-term savings.

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Reference links

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