Design for Testability | 3. Fault Models, Testing Methodologies, and Industry Standards by Pavan | Learn Smarter
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3. Fault Models, Testing Methodologies, and Industry Standards

The chapter provides an in-depth exploration of fault models, testing methodologies, and industry standards crucial for ensuring the reliability of electronic systems. It outlines various types of fault models and their implications in circuit design, as well as various testing methodologies to verify system functionality. Additionally, it highlights key industry standards that guide the testing process to maintain consistency and quality across different applications.

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Sections

  • 3

    Introduction To Key Concepts: Fault Models, Testing Methodologies, And Industry Standards

    This section introduces the fundamental concepts of fault models, testing methodologies, and industry standards essential for verifying and validating electronic systems.

    Learning Practice

  • 3.1

    Introduction To Fault Models, Testing Methodologies, And Industry Standards

    This section introduces the critical components of verifying electronic systems, focusing on fault models, testing methodologies, and industry standards.

    Learning Practice

  • 3.2

    Fault Models In Electronic Systems

    This section introduces fault models used in electronic systems, highlighting various types of faults that can occur.

    Learning Practice

  • 3.2.1

    Types Of Fault Models

    This section outlines different types of fault models prevalent in electronic systems, essential for identifying and testing defects.

    Learning Practice

  • 3.2.2

    Fault Simulation And Fault Coverage

    Fault simulation allows for the replication of failures in a system to ensure comprehensive fault detection by a test suite.

    Learning Practice

  • 3.3

    Testing Methodologies

    This section discusses various testing methodologies used in electronic systems to ensure functionality and detect defects.

    Learning Practice

  • 3.3.1

    Functional Testing

    Functional testing verifies that a system performs its intended function by comparing outputs to expected results.

    Learning Practice

  • 3.3.2

    Structural Testing

    Structural testing focuses on evaluating the internal components and connections of a circuit to ensure proper functionality and fault detection.

    Learning Practice

  • 3.3.2.1

    Scan-Based Testing

    Scan-based testing is a structural testing methodology that uses scan chains to access internal states of digital circuits for effective fault detection.

    Learning Practice

  • 3.3.3

    Built-In Self-Test (Bist)

    Built-In Self-Test (BIST) enables systems to perform self-diagnosis and testing without needing external equipment, enhancing testing efficiency.

    Learning Practice

  • 3.3.4

    Boundary Scan Testing (Jtag)

    Boundary scan testing, or JTAG, allows testing integrated circuits by accessing the boundary pins through a standardized interface.

    Learning Practice

  • 3.3.5

    Parametric Testing

    Parametric testing measures the electrical parameters of a circuit under normal operating conditions to ensure performance characteristics meet specifications.

    Learning Practice

  • 3.3.6

    At-Speed Testing

    At-speed testing ensures that electronic circuits function correctly at their intended operational speeds, detecting timing-related faults.

    Learning Practice

  • 3.4

    Industry Standards For Testability

    Industry standards ensure that electronic systems are designed, tested, and verified consistently and effectively.

    Learning Practice

  • 3.4.1

    Ieee 1149.1 (Jtag)

    IEEE 1149.1, known as JTAG, defines a standard interface for testing digital ICs at the boundary level, allowing access to internal states.

    Learning Practice

  • 3.4.2

    Ieee 1500 (Core Testability)

    The IEEE 1500 standard outlines a method for embedding test logic within the core of integrated circuits, enabling independent testing of individual cores in System-on-Chip (SoC) designs.

    Learning Practice

  • 3.4.3

    Iso 26262 (Automotive Safety Testing)

    ISO 26262 is a standard that provides essential guidelines for ensuring the functional safety of electronic systems in the automotive industry, particularly for safety-critical applications.

    Learning Practice

  • 3.4.4

    Mil-Std-883 (Military Testing)

    MIL-STD-883 is a standard used for testing microelectronic devices in military and aerospace applications, ensuring they meet stringent performance and quality standards.

    Learning Practice

  • 3.5

    Conclusion

    The conclusion underscores the importance of fault models, testing methodologies, and industry standards in ensuring the reliability of electronic systems.

    Learning Practice

References

eepe-dt3.pdf

Class Notes

Memorization

What we have learnt

  • Fault models are essential ...
  • Testing methodologies vary ...
  • Industry standards like IEE...

Final Test

Revision Tests