3. Fault Models, Testing Methodologies, and Industry Standards
The chapter provides an in-depth exploration of fault models, testing methodologies, and industry standards crucial for ensuring the reliability of electronic systems. It outlines various types of fault models and their implications in circuit design, as well as various testing methodologies to verify system functionality. Additionally, it highlights key industry standards that guide the testing process to maintain consistency and quality across different applications.
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What we have learnt
- Fault models are essential in designing test patterns and ensuring that defects in circuits can be identified effectively.
- Testing methodologies vary from functional to structural testing, each with unique advantages in detecting faults.
- Industry standards like IEEE 1149.1 and ISO 26262 ensure uniformity in testing processes, critical for quality assurance in electronic systems.
Key Concepts
- -- Fault Models
- Models that describe the types of defects that may occur within electronic systems, guiding test strategy development.
- -- Functional Testing
- A basic testing methodology where the system is evaluated to confirm it meets its intended performance by comparing outputs to expected results.
- -- Structural Testing
- Testing that focuses on verifying the internal structure and function of a system, ensuring comprehensive examination of all components.
- -- BuiltIn SelfTest (BIST)
- A testing methodology that integrates self-testing capabilities within a system, allowing it to evaluate its functionality without external equipment.
- -- Boundary Scan Testing
- A standardized interface method (JTAG) for testing the boundary level of ICs, streamlining in-circuit testing without requiring physical access to internal signals.
- -- Industry Standards
- Established guidelines (like IEEE and ISO standards) that ensure testing processes' consistency, reliability, and interoperability across various electronic applications.
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