3. Fault Models, Testing Methodologies, and Industry Standards - Design for Testability
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3. Fault Models, Testing Methodologies, and Industry Standards

3. Fault Models, Testing Methodologies, and Industry Standards

The chapter provides an in-depth exploration of fault models, testing methodologies, and industry standards crucial for ensuring the reliability of electronic systems. It outlines various types of fault models and their implications in circuit design, as well as various testing methodologies to verify system functionality. Additionally, it highlights key industry standards that guide the testing process to maintain consistency and quality across different applications.

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Sections

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  1. 3
    Introduction To Key Concepts: Fault Models, Testing Methodologies, And Industry Standards

    This section introduces the fundamental concepts of fault models, testing...

  2. 3.1
    Introduction To Fault Models, Testing Methodologies, And Industry Standards

    This section introduces the critical components of verifying electronic...

  3. 3.2
    Fault Models In Electronic Systems

    This section introduces fault models used in electronic systems,...

  4. 3.2.1
    Types Of Fault Models

    This section outlines different types of fault models prevalent in...

  5. 3.2.2
    Fault Simulation And Fault Coverage

    Fault simulation allows for the replication of failures in a system to...

  6. 3.3
    Testing Methodologies

    This section discusses various testing methodologies used in electronic...

  7. 3.3.1
    Functional Testing

    Functional testing verifies that a system performs its intended function by...

  8. 3.3.2
    Structural Testing

    Structural testing focuses on evaluating the internal components and...

  9. 3.3.2.1
    Scan-Based Testing

    Scan-based testing is a structural testing methodology that uses scan chains...

  10. 3.3.3
    Built-In Self-Test (Bist)

    Built-In Self-Test (BIST) enables systems to perform self-diagnosis and...

  11. 3.3.4
    Boundary Scan Testing (Jtag)

    Boundary scan testing, or JTAG, allows testing integrated circuits by...

  12. 3.3.5
    Parametric Testing

    Parametric testing measures the electrical parameters of a circuit under...

  13. 3.3.6
    At-Speed Testing

    At-speed testing ensures that electronic circuits function correctly at...

  14. 3.4
    Industry Standards For Testability

    Industry standards ensure that electronic systems are designed, tested, and...

  15. 3.4.1
    Ieee 1149.1 (Jtag)

    IEEE 1149.1, known as JTAG, defines a standard interface for testing digital...

  16. 3.4.2
    Ieee 1500 (Core Testability)

    The IEEE 1500 standard outlines a method for embedding test logic within the...

  17. 3.4.3
    Iso 26262 (Automotive Safety Testing)

    ISO 26262 is a standard that provides essential guidelines for ensuring the...

  18. 3.4.4
    Mil-Std-883 (Military Testing)

    MIL-STD-883 is a standard used for testing microelectronic devices in...

  19. 3.5

    The conclusion underscores the importance of fault models, testing...

What we have learnt

  • Fault models are essential in designing test patterns and ensuring that defects in circuits can be identified effectively.
  • Testing methodologies vary from functional to structural testing, each with unique advantages in detecting faults.
  • Industry standards like IEEE 1149.1 and ISO 26262 ensure uniformity in testing processes, critical for quality assurance in electronic systems.

Key Concepts

-- Fault Models
Models that describe the types of defects that may occur within electronic systems, guiding test strategy development.
-- Functional Testing
A basic testing methodology where the system is evaluated to confirm it meets its intended performance by comparing outputs to expected results.
-- Structural Testing
Testing that focuses on verifying the internal structure and function of a system, ensuring comprehensive examination of all components.
-- BuiltIn SelfTest (BIST)
A testing methodology that integrates self-testing capabilities within a system, allowing it to evaluate its functionality without external equipment.
-- Boundary Scan Testing
A standardized interface method (JTAG) for testing the boundary level of ICs, streamlining in-circuit testing without requiring physical access to internal signals.
-- Industry Standards
Established guidelines (like IEEE and ISO standards) that ensure testing processes' consistency, reliability, and interoperability across various electronic applications.

Additional Learning Materials

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