Practice Introduction to Fault Models, Testing Methodologies, and Industry Standards - 3.1 | 3. Fault Models, Testing Methodologies, and Industry Standards | Design for Testability
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3.1 - Introduction to Fault Models, Testing Methodologies, and Industry Standards

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Learning

Practice Questions

Test your understanding with targeted questions related to the topic.

Question 1

Easy

Define what a fault model is.

💡 Hint: Think about how failures are categorized in circuits.

Question 2

Easy

What does a stuck-at fault represent?

💡 Hint: Consider what happens when a circuit can't change its output.

Practice 4 more questions and get performance evaluation

Interactive Quizzes

Engage in quick quizzes to reinforce what you've learned and check your comprehension.

Question 1

What is a stuck-at fault?

  • A fault where a signal is constantly high
  • A fault that allows signal transition
  • A fault in analog circuits

💡 Hint: Think about what stuck-at means.

Question 2

Is functional testing sufficient to identify all faults?

  • True
  • False

💡 Hint: Consider what is not covered by functional tests.

Solve 1 more question and get performance evaluation

Challenge Problems

Push your limits with challenges.

Question 1

Consider a circuit with multiple pathways. If one pathway is subject to a stuck-at fault, how could that affect the overall circuit functionality?

💡 Hint: Think about how a stuck line impacts signal flow.

Question 2

Describe a scenario in which using BIST might be more beneficial than traditional testing methods.

💡 Hint: Consider accessibility and the need for independence from external equipment.

Challenge and get performance evaluation