Practice Boundary Scan Testing (JTAG) - 3.3.4 | 3. Fault Models, Testing Methodologies, and Industry Standards | Design for Testability
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Practice Questions

Test your understanding with targeted questions related to the topic.

Question 1

Easy

What does JTAG stand for?

💡 Hint: Think about what the acronym could represent in the testing context.

Question 2

Easy

Name one key advantage of boundary scan testing.

💡 Hint: Consider the issues faced with dense layouts.

Practice 4 more questions and get performance evaluation

Interactive Quizzes

Engage in quick quizzes to reinforce what you've learned and check your comprehension.

Question 1

What does JTAG allow engineers to do with ICs?

  • Access internal circuitry
  • Test boundary pins
  • Measure signal traces

💡 Hint: Think about the main focus of JTAG testing.

Question 2

True or False: JTAG is used primarily for testing analog components rather than digital ones.

  • True
  • False

💡 Hint: Recall the context in which JTAG is typically applied.

Solve and get performance evaluation

Challenge Problems

Push your limits with challenges.

Question 1

Describe how JTAG could be integrated into a new product design and what considerations an engineer must take for effective testing.

💡 Hint: Think about the physical arrangement of components.

Question 2

Evaluate the potential risks and drawbacks of relying on JTAG alone in a testing strategy for a complex embedded system.

💡 Hint: Consider the limitations of JTAG testing.

Challenge and get performance evaluation