Practice Simplified Access to Internal Circuitry - 5.4.1 | 5. Scan Chains and Serial Testing | Design for Testability
K12 Students

Academics

AI-Powered learning for Grades 8–12, aligned with major Indian and international curricula.

Professionals

Professional Courses

Industry-relevant training in Business, Technology, and Design to help professionals and graduates upskill for real-world careers.

Games

Interactive Games

Fun, engaging games to boost memory, math fluency, typing speed, and English skills—perfect for learners of all ages.

Practice Questions

Test your understanding with targeted questions related to the topic.

Question 1

Easy

What is a scan chain?

💡 Hint: Think about how flip-flops can be arranged.

Question 2

Easy

What do we call the process of shifting data into a scan chain?

💡 Hint: Consider the direction of the data flow.

Practice 4 more questions and get performance evaluation

Interactive Quizzes

Engage in quick quizzes to reinforce what you've learned and check your comprehension.

Question 1

What does 'scan-in' refer to in the context of scan chains?

  • The process of shifting data out
  • The process of shifting data in
  • A type of fault

💡 Hint: It's what you do when you want to push data into the scan.

Question 2

True or False: Scan chains can only be used for detecting stuck-at faults.

  • True
  • False

💡 Hint: Consider all the fault types mentioned in the section.

Solve and get performance evaluation

Challenge Problems

Push your limits with challenges.

Question 1

Given a digital circuit with a complex arrangement of components, how would you design a scan chain to optimize testing? Include considerations for fault types.

💡 Hint: Think about potential bottlenecks in your design.

Question 2

Discuss a scenario where the implementation of scan chains might complicate the circuit design. Provide examples of the overhead involved.

💡 Hint: Consider how additional components affect circuit complexity.

Challenge and get performance evaluation