5.4.1. Simplified Access to Internal Circuitry

Try these first

1. 1.

   What is a scan chain?

   Hint

   Think about how flip-flops can be arranged.

2. 2.

   What do we call the process of shifting data into a scan chain?

   Hint

   Consider the direction of the data flow.

3. 3.

   What does 'scan-in' refer to in the context of scan chains?

   • The process of shifting data out
   • The process of shifting data in
   • A type of fault

   Hint

   It's what you do when you want to push data into the scan.

4. 4.

   True or False: Scan chains can only be used for detecting stuck-at faults.

   • True
   • False

   Hint

   Consider all the fault types mentioned in the section.

5. 5.

   Given a digital circuit with a complex arrangement of components, how would you design a scan chain to optimize testing? Include considerations for fault types.

   Hint

   Think about potential bottlenecks in your design.

6. 6.

   Discuss a scenario where the implementation of scan chains might complicate the circuit design. Provide examples of the overhead involved.

   Hint

   Consider how additional components affect circuit complexity.