8.2.1. Scan-Based Testing

Try these first

1. 1.

   What is a scan chain?

   Hint

   Think about how signals travel through circuits!

2. 2.

   Name one type of fault that scan-based testing can detect.

   Hint

   Consider how a signal might behave incorrectly.

3. 3.

   What does scan-based testing primarily aim to improve?

   • Cost Reduction
   • Fault Coverage
   • Performance

   Hint

   Think about what testing focuses on enhancing.

4. 4.

   True or False: Scan mode provides access to internal state without the need for physical access.

   • True
   • False

   Hint

   Reflect on the difference scan mode makes.

5. 5.

   Consider a complex digital system where scan-based testing has been implemented. Discuss how you would design the scan chain to ensure the maximum fault coverage and minimal overhead.

   Hint

   Think about how to integrate testability features with minimal disruption.

6. 6.

   How would you address the power consumption challenges associated with scan-based testing while maintaining effective fault coverage?

   Hint

   Reflect on ways to reduce power during test phases.