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Practice Questions
Test your understanding with targeted questions related to the topic.
Question 1
Easy
What does DFT stand for?
💡 Hint: Think about what it means to design systems that are easier to test.
Question 2
Easy
Name one advantage of Built-In Self-Test.
💡 Hint: Consider scenarios where external equipment might not be available.
Practice 4 more questions and get performance evaluation
Interactive Quizzes
Engage in quick quizzes to reinforce what you've learned and check your comprehension.
Question 1
What is a primary purpose of Scan-Based Testing?
- To increase manufacturing speed
- To enable easier testing of internal signals
- To reduce physical size
💡 Hint: Consider what 'scan' refers to in a testing context.
Question 2
BIST allows systems to test themselves. True or False?
- True
- False
💡 Hint: Think about scenarios where external testing might not be possible.
Solve 1 more question and get performance evaluation
Challenge Problems
Push your limits with challenges.
Question 1
Discuss the trade-offs of implementing BIST in a critical embedded system environment. Consider aspects such as overhead, testing accuracy, and real-time applications.
💡 Hint: Focus on the balance between benefits and potential drawbacks in real-time settings.
Question 2
Design a scenario where Scan-Based Testing outperforms traditional debugging methods. Enumerate the advantages in detail.
💡 Hint: Think about efficiency and time savings in fast-paced production environments.
Challenge and get performance evaluation