Practice Increased Design Complexity - 4.5.1 | 4. Built-in Self-Test (BIST) Techniques | Design for Testability
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4.5.1 - Increased Design Complexity

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Learning

Practice Questions

Test your understanding with targeted questions related to the topic.

Question 1

Easy

What does increased design complexity mean in the context of BIST?

💡 Hint: Think about how incorporates more elements into the circuit.

Question 2

Easy

Explain stuck-at faults.

💡 Hint: Consider how a light switch might get stuck in the 'on' position.

Practice 4 more questions and get performance evaluation

Interactive Quizzes

Engage in quick quizzes to reinforce what you've learned and check your comprehension.

Question 1

What is a significant downside of integrating BIST into circuit design?

  • Increased Fault Detection
  • Increased Design Complexity
  • Reduced Power Consumption

💡 Hint: Think about the balance between self-testing capabilities and design simplicity.

Question 2

True or False: BIST is always effective for detecting all fault types.

  • True
  • False

💡 Hint: Consider the limitations of BIST as discussed in class.

Solve and get performance evaluation

Challenge Problems

Push your limits with challenges.

Question 1

Design a circuit that integrates BIST for a simple flip flop. Discuss the potential complexities and how you will ensure high fault coverage.

💡 Hint: Consider what fault types you might face in a flip flop and how you can accommodate them in your design.

Question 2

Evaluate a hypothetical mixed-signal BIST setup for a sensor. Analyze its effectiveness and suggest improvements.

💡 Hint: Reflect on mixed signal characteristics and how they differ from digital-only systems.

Challenge and get performance evaluation