Practice - Limitations of BIST in Electronic Circuit Testing
Enroll to start learning
You’ve not yet enrolled in this course. Please enroll for free to listen to audio lessons, classroom podcasts and take practice test.
Practice Questions
Test your understanding with targeted questions
What is one disadvantage of increased design complexity with BIST?
💡 Hint: Think about added components and their implications.
What type of faults do BIST techniques primarily struggle to detect?
💡 Hint: Consider the limitations of predefined test patterns.
4 more questions available
Interactive Quizzes
Quick quizzes to reinforce your learning
What is one disadvantage of using BIST?
💡 Hint: Look for the option that indicates a challenge in the design phase.
Does BIST improve fault coverage for complex faults?
💡 Hint: Remember the limitations specified in this aspect.
1 more question available
Challenge Problems
Push your limits with advanced challenges
Propose a redesign of a digital circuit that includes BIST but minimizes the design complexity. What strategies might you use?
💡 Hint: Think about how modularization in circuit design can simplify integration.
Consider a safety-critical embedded system using BIST. Describe how you would address the limitations of fault coverage and unknown fault detection.
💡 Hint: Imagine what strategies can enhance reliability and fault detection in critical systems.
Get performance evaluation
Reference links
Supplementary resources to enhance your learning experience.