Practice Limitations of BIST in Electronic Circuit Testing - 4.5 | 4. Built-in Self-Test (BIST) Techniques | Design for Testability
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Practice Questions

Test your understanding with targeted questions related to the topic.

Question 1

Easy

What is one disadvantage of increased design complexity with BIST?

💡 Hint: Think about added components and their implications.

Question 2

Easy

What type of faults do BIST techniques primarily struggle to detect?

💡 Hint: Consider the limitations of predefined test patterns.

Practice 4 more questions and get performance evaluation

Interactive Quizzes

Engage in quick quizzes to reinforce what you've learned and check your comprehension.

Question 1

What is one disadvantage of using BIST?

  • It reduces system reliability
  • It increases design complexity
  • It is costlier than external testing

💡 Hint: Look for the option that indicates a challenge in the design phase.

Question 2

Does BIST improve fault coverage for complex faults?

  • True
  • False

💡 Hint: Remember the limitations specified in this aspect.

Solve 1 more question and get performance evaluation

Challenge Problems

Push your limits with challenges.

Question 1

Propose a redesign of a digital circuit that includes BIST but minimizes the design complexity. What strategies might you use?

💡 Hint: Think about how modularization in circuit design can simplify integration.

Question 2

Consider a safety-critical embedded system using BIST. Describe how you would address the limitations of fault coverage and unknown fault detection.

💡 Hint: Imagine what strategies can enhance reliability and fault detection in critical systems.

Challenge and get performance evaluation