4.5. Limitations of BIST in Electronic Circuit Testing

Try these first

1. 1.

   What is one disadvantage of increased design complexity with BIST?

   Hint

   Think about added components and their implications.

2. 2.

   What type of faults do BIST techniques primarily struggle to detect?

   Hint

   Consider the limitations of predefined test patterns.

3. 3.

   What is one disadvantage of using BIST?

   • It reduces system reliability
   • It increases design complexity
   • It is costlier than external testing

   Hint

   Look for the option that indicates a challenge in the design phase.

4. 4.

   Does BIST improve fault coverage for complex faults?

   • True
   • False

   Hint

   Remember the limitations specified in this aspect.

5. 5.

   Propose a redesign of a digital circuit that includes BIST but minimizes the design complexity. What strategies might you use?

   Hint

   Think about how modularization in circuit design can simplify integration.

6. 6.

   Consider a safety-critical embedded system using BIST. Describe how you would address the limitations of fault coverage and unknown fault detection.

   Hint

   Imagine what strategies can enhance reliability and fault detection in critical systems.