5.1.3 - Atomic Force Microscopy (AFM)
Enroll to start learning
You’ve not yet enrolled in this course. Please enroll for free to listen to audio lessons, classroom podcasts and take practice test.
Practice Questions
Test your understanding with targeted questions
What does AFM stand for?
💡 Hint: Think of force and microscopy together.
What does the tip on an AFM do?
💡 Hint: A sharp tip to detect features.
4 more questions available
Interactive Quizzes
Quick quizzes to reinforce your learning
What principle does AFM rely on for imaging?
💡 Hint: Focus on how the tip interacts with the surface.
True or False: AFM can only be used in a vacuum.
💡 Hint: Think about the environments you might want to study.
2 more questions available
Challenge Problems
Push your limits with advanced challenges
Design an experiment using AFM to analyze the surface roughness of a newly synthesized nanomaterial. What considerations would you have to take into account?
💡 Hint: Reflect on the specific attributes you need to image and measure.
Discuss the impact of cantilever spring constant on AFM measurements. How does changing this affect data acquisition?
💡 Hint: Think about how sensitivity and force interactions relate.
Get performance evaluation
Reference links
Supplementary resources to enhance your learning experience.