Practice Atomic Force Microscopy (AFM) - 5.1.3 | Chapter 5: Characterization Techniques for Nanomaterials | Nanotechnology Basic
K12 Students

Academics

AI-Powered learning for Grades 8–12, aligned with major Indian and international curricula.

Academics
Professionals

Professional Courses

Industry-relevant training in Business, Technology, and Design to help professionals and graduates upskill for real-world careers.

Professional Courses
Games

Interactive Games

Fun, engaging games to boost memory, math fluency, typing speed, and English skillsβ€”perfect for learners of all ages.

games

Practice Questions

Test your understanding with targeted questions related to the topic.

Question 1

Easy

What does AFM stand for?

πŸ’‘ Hint: Think of force and microscopy together.

Question 2

Easy

What does the tip on an AFM do?

πŸ’‘ Hint: A sharp tip to detect features.

Practice 4 more questions and get performance evaluation

Interactive Quizzes

Engage in quick quizzes to reinforce what you've learned and check your comprehension.

Question 1

What principle does AFM rely on for imaging?

  • Electric current
  • Laser deflections
  • Surface interactions

πŸ’‘ Hint: Focus on how the tip interacts with the surface.

Question 2

True or False: AFM can only be used in a vacuum.

  • True
  • False

πŸ’‘ Hint: Think about the environments you might want to study.

Solve 2 more questions and get performance evaluation

Challenge Problems

Push your limits with challenges.

Question 1

Design an experiment using AFM to analyze the surface roughness of a newly synthesized nanomaterial. What considerations would you have to take into account?

πŸ’‘ Hint: Reflect on the specific attributes you need to image and measure.

Question 2

Discuss the impact of cantilever spring constant on AFM measurements. How does changing this affect data acquisition?

πŸ’‘ Hint: Think about how sensitivity and force interactions relate.

Challenge and get performance evaluation