Chapter 5: Characterization Techniques for Nanomaterials
Characterization techniques are vital in the field of nanotechnology, offering essential insights into the structural and surface properties of nanomaterials through various microscopy and spectroscopy methods. Surface area and porosity analysis further enhance understanding of nanomaterial behavior and applications. Case studies illustrate the practical application of these techniques in interpreting characterization data.
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What we have learnt
- Various microscopy techniques such as SEM, TEM, AFM, and STM are used for studying nanomaterials.
- Spectroscopy methods like UV-Vis, XRD, Raman, and FTIR reveal chemical composition and structure of nanomaterials.
- Surface area and porosity analysis are crucial for understanding catalytic activity and performance in applications.
Key Concepts
- -- Scanning Electron Microscopy (SEM)
- A microscopy technique that produces detailed images of surfaces by scanning with a focused electron beam.
- -- Transmission Electron Microscopy (TEM)
- A microscopy method used to view the internal structure of thin samples at high resolution using transmitted electrons.
- -- Atomic Force Microscopy (AFM)
- A technique that provides 3D surface topography by scanning a sharp tip over a sample surface to measure intermolecular forces.
- -- Surface Area Analysis
- The method of evaluating the surface area of nanomaterials, crucial for their properties and applications.
- -- Spectroscopy
- The study of how matter interacts with light or other radiation, used to analyze materials composition and structure.
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