Practice Design Complexity and Overhead - 6.3.1 | 6. Implementation and Optimization of Scan Chains for Improved Testability | Design for Testability
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Practice Questions

Test your understanding with targeted questions related to the topic.

Question 1

Easy

What does area overhead refer to in the context of scan chains?

💡 Hint: Think about the extra components and their spatial requirements.

Question 2

Easy

How does scan chain implementation affect performance?

💡 Hint: Consider the time taken to move bits through the chain.

Practice 4 more questions and get performance evaluation

Interactive Quizzes

Engage in quick quizzes to reinforce what you've learned and check your comprehension.

Question 1

What is area overhead?

  • Cost of manufacturing
  • Extra space used on the chip
  • Test coverage ratio

💡 Hint: Think about what happens physically to the chip.

Question 2

True or False: Longer scan chains always improve fault detection.

  • True
  • False

💡 Hint: Reflect on the negative impacts of extending scan chains.

Solve and get performance evaluation

Challenge Problems

Push your limits with challenges.

Question 1

You are designing a test circuit that uses a scan chain with 50 flip-flops. Calculate the expected area overhead if each flip-flop consumes 2 mm², and suggest optimization strategies to mitigate this.

💡 Hint: Focus on assessing necessity versus efficiency.

Question 2

A scan chain design has led to a 30% decrease in performance in a circuit. Suggest and justify three modifications to improve performance while maintaining test coverage.

💡 Hint: Consider approaches that can simultaneously address both issues.

Challenge and get performance evaluation