Practice Improving Fault Coverage - 6.4.3 | 6. Implementation and Optimization of Scan Chains for Improved Testability | Design for Testability
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Practice Questions

Test your understanding with targeted questions related to the topic.

Question 1

Easy

What is a redundant flip-flop?

💡 Hint: Think about backup systems.

Question 2

Easy

What type of fault occurs when a flip-flop fails to change state?

💡 Hint: Focus on state changes.

Practice 4 more questions and get performance evaluation

Interactive Quizzes

Engage in quick quizzes to reinforce what you've learned and check your comprehension.

Question 1

What are redundant flip-flops used for?

  • To reduce circuit area
  • To improve fault observability
  • To speed up transitions

💡 Hint: Think of their role in visibility and fault detection.

Question 2

True or False: Delay faults are always visible during normal operation.

  • True
  • False

💡 Hint: Consider how testing approaches might differ from normal operations.

Solve 2 more questions and get performance evaluation

Challenge Problems

Push your limits with challenges.

Question 1

Consider a digital circuit designed with just enough flip-flops for regular operation. Discuss how adding redundant flip-flops might improve test strategy despite increased area.

💡 Hint: Think about the impact of observability.

Question 2

Create a testing strategy that utilizes advanced fault models for a hypothetical high-speed circuit. Outline potential pitfalls and how to overcome them.

💡 Hint: Focus on the unique challenges high-speed circuits face.

Challenge and get performance evaluation