Practice Optimization Techniques for Scan Chains - 6.4 | 6. Implementation and Optimization of Scan Chains for Improved Testability | Design for Testability
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Practice Questions

Test your understanding with targeted questions related to the topic.

Question 1

Easy

What is a scan chain?

💡 Hint: Think about how circuits can be tested effectively.

Question 2

Easy

What technique is used to reduce power during testing?

💡 Hint: Consider how parts of a circuit can be turned off.

Practice 4 more questions and get performance evaluation

Interactive Quizzes

Engage in quick quizzes to reinforce what you've learned and check your comprehension.

Question 1

What is the purpose of scan chain partitioning?

  • To increase the length of the scan chain
  • To split the scan chain into smaller parts for parallel testing
  • To connect more flip-flops

💡 Hint: Think about how to make the testing process faster.

Question 2

True or False: Power gating can help in reducing the area of a circuit.

  • True
  • False

💡 Hint: Consider what each technique is targeted at.

Solve 1 more question and get performance evaluation

Challenge Problems

Push your limits with challenges.

Question 1

Discuss the trade-offs involved in using redundant flip-flops versus maintaining a minimal design. What are the implications for testing and overall circuit performance?

💡 Hint: Consider the balance between thoroughness and simplicity.

Question 2

Create a testing strategy for a circuit using both static and dynamic scan length optimization techniques. What factors will influence your decisions?

💡 Hint: Consider how different testing environments might impact your strategy.

Challenge and get performance evaluation