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The chapter on MOSFETs introduces the basic operation and characteristics of Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs) emphasizing their high input impedance and scalability for VLSI circuits. Key structural components, operational modes, I-V characteristics, and fundamental parameters are discussed extensively. The chapter concludes with the laboratory characterization methods and the impact of technology scaling based on Moore's Law.
References
ee4-ac-4.pdfClass Notes
Memorization
What we have learnt
Final Test
Revision Tests
Term: MOSFET (MetalOxideSemiconductor FieldEffect Transistor)
Definition: A voltage-controlled three-terminal device used in modern electronics characterized by its high input impedance.
Term: Threshold Voltage (V_th)
Definition: The minimum gate-to-source voltage that is required to create a conducting path between the drain and source terminals.
Term: Transconductance (g_m)
Definition: A measure of the sensitivity of the drain current to changes in the gate-source voltage, often used to evaluate the gain of the device.
Term: ShortChannel Effects
Definition: Phenomena that occur in MOSFETs with small channel lengths, impacting performance metrics such as velocity saturation and drain-induced barrier lowering.
Term: IV Characteristics
Definition: The relationship between the drain current and the drain-source voltage under various gate-source voltage conditions, important for understanding device behavior.