Practice Scanning Electron Microscopy (SEM) - 3.4.2 | 3. Characterize Semiconductor Materials and Devices | Microfabrication and Semiconductor materials
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Practice Questions

Test your understanding with targeted questions related to the topic.

Question 1

Easy

What does SEM stand for?

πŸ’‘ Hint: Think about imaging techniques.

Question 2

Easy

Name one key function of SEM.

πŸ’‘ Hint: Consider what SEM observes.

Practice 4 more questions and get performance evaluation

Interactive Quizzes

Engage in quick quizzes to reinforce what you've learned and check your comprehension.

Question 1

What does SEM primarily analyze?

  • Electrical properties
  • Surface morphology
  • Thermal properties

πŸ’‘ Hint: Think about what aspect of the sample SEM focuses on.

Question 2

True or False: SEM can only be used for conductive materials.

  • True
  • False

πŸ’‘ Hint: Consider the adaptations used for different materials.

Solve 1 more question and get performance evaluation

Challenge Problems

Push your limits with challenges.

Question 1

You are tasked with analyzing a non-conductive ceramic semiconductor using SEM. Describe the steps you would take to prepare this sample and the reasoning behind each step.

πŸ’‘ Hint: Consider the challenges with electron beams and charging on non-conductive materials.

Question 2

How would you approach a situation where your SEM images of a semiconductor contain streaking artifacts? What could be the cause, and how would you mitigate it?

πŸ’‘ Hint: Think about how setup and sample conditions affect imaging quality.

Challenge and get performance evaluation