Practice Scanning Electron Microscopy (sem) (3.4.2) - Characterize Semiconductor Materials and Devices
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Scanning Electron Microscopy (SEM)

Practice - Scanning Electron Microscopy (SEM)

Learning

Practice Questions

Test your understanding with targeted questions

Question 1 Easy

What does SEM stand for?

💡 Hint: Think about imaging techniques.

Question 2 Easy

Name one key function of SEM.

💡 Hint: Consider what SEM observes.

4 more questions available

Interactive Quizzes

Quick quizzes to reinforce your learning

Question 1

What does SEM primarily analyze?

Electrical properties
Surface morphology
Thermal properties

💡 Hint: Think about what aspect of the sample SEM focuses on.

Question 2

True or False: SEM can only be used for conductive materials.

True
False

💡 Hint: Consider the adaptations used for different materials.

1 more question available

Challenge Problems

Push your limits with advanced challenges

Challenge 1 Hard

You are tasked with analyzing a non-conductive ceramic semiconductor using SEM. Describe the steps you would take to prepare this sample and the reasoning behind each step.

💡 Hint: Consider the challenges with electron beams and charging on non-conductive materials.

Challenge 2 Hard

How would you approach a situation where your SEM images of a semiconductor contain streaking artifacts? What could be the cause, and how would you mitigate it?

💡 Hint: Think about how setup and sample conditions affect imaging quality.

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Reference links

Supplementary resources to enhance your learning experience.