3. Characterize Semiconductor Materials and Devices
Characterization of semiconductor materials and devices encompasses various techniques that assess electrical, optical, and structural properties. These methods play a crucial role in validating performance and ensuring quality in semiconductor production. Effective evaluation relies on a combination of techniques, from electrical measurements to advanced structural analyses, aligning results with standardized protocols for consistency.
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What we have learnt
- Comprehensive characterization involves employing multiple techniques to evaluate materials and devices.
- Electrical measurements are paramount for assessing device performance.
- Structural and optical methods enhance the understanding of materials and support electrical data.
Key Concepts
- -- Resistivity
- A measure of how strongly a material opposes the flow of electric current, defined using the formula ρ = RA/l.
- -- Hall Effect
- A phenomenon where a voltage difference is induced across an electrical conductor when a magnetic field is applied, helping to determine carrier concentration and mobility.
- -- Xray Diffraction (XRD)
- A characterization technique used to investigate the crystalline structure of materials by analyzing the pattern of X-rays diffracted by the sample.
- -- Photoluminescence (PL)
- An optical characterization method that involves excited electrons emitting light when they return to a lower energy state, used for bandgap determination.
Additional Learning Materials
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