Practice Spectroscopic Ellipsometry - 3.3.1 | 3. Characterize Semiconductor Materials and Devices | Microfabrication and Semiconductor materials
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Practice Questions

Test your understanding with targeted questions related to the topic.

Question 1

Easy

What does spectroscopic ellipsometry measure?

πŸ’‘ Hint: Think of the key parameters discussed.

Question 2

Easy

What does the extinction coefficient indicate?

πŸ’‘ Hint: Focus on absorption properties.

Practice 4 more questions and get performance evaluation

Interactive Quizzes

Engage in quick quizzes to reinforce what you've learned and check your comprehension.

Question 1

What key parameters can be derived from spectroscopic ellipsometry?

  • Thickness
  • Density
  • Resistivity
  • Refractive Index
  • Extinction Coefficient
  • Thickness
  • Mobility
  • Voltage

πŸ’‘ Hint: Focus on the three critical properties.

Question 2

True or False: Spectroscopic ellipsometry can damage the sample being analyzed.

  • True
  • False

πŸ’‘ Hint: Consider the technique's nature.

Solve 1 more question and get performance evaluation

Challenge Problems

Push your limits with challenges.

Question 1

A thin film has a measured thickness of 50 nm with a refractive index of 1.5. Calculate the change in speed of light as it enters the film, compared to its speed in air.

πŸ’‘ Hint: Use the relationship of light speed in different media.

Question 2

Discuss how the extinction coefficient affects the performance of an optical device fabricated with a thin film characterized by spectroscopic ellipsometry.

πŸ’‘ Hint: Think about the relationship between absorption and optical device functionality.

Challenge and get performance evaluation