Practice Structural Characterization (3.4) - Characterize Semiconductor Materials and Devices
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Structural Characterization

Practice - Structural Characterization

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Practice Questions

Test your understanding with targeted questions

Question 1 Easy

What does XRD stand for?

💡 Hint: What type of analysis does it involve?

Question 2 Easy

What type of information can SEM provide?

💡 Hint: Think about what it can show about the material's surface.

4 more questions available

Interactive Quizzes

Quick quizzes to reinforce your learning

Question 1

What is the primary purpose of X-ray Diffraction?

Surface imaging
Crystal structure analysis
Element composition

💡 Hint: Focus on what the main focus of XRD is.

Question 2

True or False: SEM can be used to determine the crystal structure of a material.

True
False

💡 Hint: Consider the capabilities of each technique.

1 more question available

Challenge Problems

Push your limits with advanced challenges

Challenge 1 Hard

Given a sample with a diffraction peak at 30°, use Bragg's law to illustrate how you would determine the lattice spacing if the X-ray wavelength is 0.154 nm.

💡 Hint: Calculate sin(30°) first.

Challenge 2 Hard

Consider a semiconductor that shows striations in its SEM image. Discuss the potential implications on its performance and methods to investigate the striations further.

💡 Hint: Connect the surface features observed in SEM with the electronic properties of the semiconductor.

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Reference links

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