Practice Structural Characterization - 3.4 | 3. Characterize Semiconductor Materials and Devices | Microfabrication and Semiconductor materials
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Practice Questions

Test your understanding with targeted questions related to the topic.

Question 1

Easy

What does XRD stand for?

πŸ’‘ Hint: What type of analysis does it involve?

Question 2

Easy

What type of information can SEM provide?

πŸ’‘ Hint: Think about what it can show about the material's surface.

Practice 4 more questions and get performance evaluation

Interactive Quizzes

Engage in quick quizzes to reinforce what you've learned and check your comprehension.

Question 1

What is the primary purpose of X-ray Diffraction?

  • Surface imaging
  • Crystal structure analysis
  • Element composition

πŸ’‘ Hint: Focus on what the main focus of XRD is.

Question 2

True or False: SEM can be used to determine the crystal structure of a material.

  • True
  • False

πŸ’‘ Hint: Consider the capabilities of each technique.

Solve 1 more question and get performance evaluation

Challenge Problems

Push your limits with challenges.

Question 1

Given a sample with a diffraction peak at 30Β°, use Bragg's law to illustrate how you would determine the lattice spacing if the X-ray wavelength is 0.154 nm.

πŸ’‘ Hint: Calculate sin(30Β°) first.

Question 2

Consider a semiconductor that shows striations in its SEM image. Discuss the potential implications on its performance and methods to investigate the striations further.

πŸ’‘ Hint: Connect the surface features observed in SEM with the electronic properties of the semiconductor.

Challenge and get performance evaluation