Practice Key DFT Techniques - 10.2.2 | 10. Introduction to DFT and DFM Principles | SOC Design 2: Chip Implementation with Physical Design leading to Tape-Out
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Practice Questions

Test your understanding with targeted questions related to the topic.

Question 1

Easy

What does Scan Chain Insertion involve?

πŸ’‘ Hint: Consider how internal testing is simplified.

Question 2

Easy

What is the primary function of BIST?

πŸ’‘ Hint: Think of automation in testing.

Practice 4 more questions and get performance evaluation

Interactive Quizzes

Engage in quick quizzes to reinforce what you've learned and check your comprehension.

Question 1

What is the primary purpose of Scan Chain Insertion?

  • To increase complexity
  • To allow easier access to internal signals
  • To reduce testing time

πŸ’‘ Hint: Think about how internal signals are accessed.

Question 2

True or False: Built-In Self-Test (BIST) eliminates the need for any external testing.

  • True
  • False

πŸ’‘ Hint: Consider how self-testing might operate alongside other testing methods.

Solve 2 more questions and get performance evaluation

Challenge Problems

Push your limits with challenges.

Question 1

Design a hypothetical VLSI chip incorporating all five DFT techniques. Describe the chip's basic functionality and explain how each DFT technique contributes to its testability.

πŸ’‘ Hint: Consider each technique's role and how they complement each other.

Question 2

Critically analyze the trade-offs of using BIST in consumer electronics versus high-reliability applications. Discuss potential impacts on cost and performance.

πŸ’‘ Hint: Think about the different priorities in consumer versus critical systems.

Challenge and get performance evaluation