Practice Key Dft Techniques (10.2.2) - Introduction to DFT and DFM Principles
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Key DFT Techniques

Practice - Key DFT Techniques

Learning

Practice Questions

Test your understanding with targeted questions

Question 1 Easy

What does Scan Chain Insertion involve?

💡 Hint: Consider how internal testing is simplified.

Question 2 Easy

What is the primary function of BIST?

💡 Hint: Think of automation in testing.

4 more questions available

Interactive Quizzes

Quick quizzes to reinforce your learning

Question 1

What is the primary purpose of Scan Chain Insertion?

To increase complexity
To allow easier access to internal signals
To reduce testing time

💡 Hint: Think about how internal signals are accessed.

Question 2

True or False: Built-In Self-Test (BIST) eliminates the need for any external testing.

True
False

💡 Hint: Consider how self-testing might operate alongside other testing methods.

2 more questions available

Challenge Problems

Push your limits with advanced challenges

Challenge 1 Hard

Design a hypothetical VLSI chip incorporating all five DFT techniques. Describe the chip's basic functionality and explain how each DFT technique contributes to its testability.

💡 Hint: Consider each technique's role and how they complement each other.

Challenge 2 Hard

Critically analyze the trade-offs of using BIST in consumer electronics versus high-reliability applications. Discuss potential impacts on cost and performance.

💡 Hint: Think about the different priorities in consumer versus critical systems.

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Reference links

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